ERTL (South) undertakes testing of components like Integrated Circuits, Discrete Devices, Resistors, Capacitors, Inductors, Crystal Oscillators, Pulse Transformers etc. as per MIL/ JSS/ IEC/IS/ Customer Specifications.
ERTL (South) is the leading laboratory for the Screening of Electronic devices like LCR devices, Discrete devices, Digital and linear ICs of different packages.
Measurement Capability
| Parameter / Test | Range / Accuracy / Specifications |
|---|---|
| Digital Integrated Circuits (SSI/MSI/LSI) | Functional & Parametric Measurements |
| Clamp Voltage | 0 to -10 V |
| Output Voltage | 0 to 20 V |
| Input Current/ Off state current/ Output Current | 0 to 10 mA |
| Short Circuit Current/ Supply Current | 0 to 200 mA |
| Threshold Voltage | -10 V to +10 V |
| Delay Time | 0-900 ns |
| Linear Integrated Circuits ( Op-amp/ Regulator/ PWM) | Functional & Parametric Measurements |
| Offset Voltage | 0-200 mV |
| Offset/Bias Current | 0-20 µA |
| CMRR/ PSRR | 130 dB |
| Slew rate | 0-100 V/µs |
| Open Loop Gain | 130 dB |
| GBP | 200 MHz |
| Output Voltage | ±16 V & 0-51 V |
| Supply Current | 0 to 200 mA |
| Line/ Load Regulation | 0-1500 mV |
| Ripple Rejection | 100 dB |
| Quiescent Current | 0-250 mA |
| Short Circuit Current | 0-3.2 A |
| Linear Integrated Circuits ( Op-amp/ Regulator/ PWM) | Functional & Parametric Measurements |
Discrete Devices
| 3000 V/ 400 A |
Resistors
| 1 Ω to 1 MΩ (NABL accredited) |
Capacitors
| 10 pF to 1 F |
| Inductors | 1nH to 10 H (Test frequency up to 30 MHz) |
| Crystal Oscillators | Square wave up to 80 MHz
|
| Pulse Transformers | 180 mA/ 60 V (Max) ,Single & dual type |
List of Major Facilities
| Facility / Equipment / Tools | Make and Model |
|---|---|
| Universal Test System | SZ M3000 |
| Intelligent Universal Programmer | ESA IUP- XP |
| Programmable DC Source | Yokogawa- 7651 |
| Digital Storage Oscilloscope | TDS-2014 |
| Curve Tracer | Tektronix 370A, Tektronix 371A |
| 8½ digit Digital Multimeter | Fluke 8508A |
| 7½ digit Digital Multimeter | Wavetek 1271 |
| Digital Storage Oscilloscope | Tektronix 3054C, Owon SDS 8202 |
| LCR Meter | Agilent E4980A, HP 4284A, HP 4285A |
| Function Generator | Tektronix AFG3051C |
Major Devices Tested (Leaded / SMD)
- Digital Integrated Circuits (SSI/MSI/LSI)
- Linear Integrated Circuits (Op-amp/ Regulator/ PWM)
- Discrete Devices (Diodes, Transistors, MOSFETs, SCRs ….)
- Passive Devices (Resistors, Capacitors, Inductors)
- Crystal Oscillators
- Pulse Transformers
