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Component Testing

ERTL (South) undertakes testing of components like Integrated Circuits, Discrete Devices, Resistors, Capacitors, Inductors, Crystal Oscillators, Pulse Transformers etc. as per MIL/ JSS/ IEC/IS/ Customer Specifications.

ERTL (South) is the leading laboratory in the country for the Screening of Electronic devices like LCR devices, Discrete devices, Digital and linear ICs of different sizes and different packages.

Measurement Capability

Parameter / Test Range / Accuracy / Specifications

Digital Integrated Circuits (SSI/MSI/LSI)

Functional & Parametric Measurements

Clamp Voltage

0 to -10 V

Output Voltage

0 to 20 V

Input Current/ Off state current/ Output Current

0 to 10 mA

Short Circuit Current/ Supply Current

0 to 200 mA

Threshold Voltage

-10 V to +10 V

Delay Time

0-900 ns

Linear Integrated Circuits ( Op-amp/ Regulator/ PWM) Functional & Parametric Measurements

Offset Voltage

0-200 mV

Offset/Bias Current

0-20 µA

CMRR/ PSRR

130 dB

Slew rate

0-100 V/µs

Open Loop Gain

130 dB

GBP

200 MHz

Output Voltage

±16 V & 0-51 V

Supply Current

0 to 200 mA

Line/ Load Regulation

0-1500 mV

Ripple Rejection

100 dB

Quiescent Current

0-250 mA

Short Circuit Current

0-3.2 A

 

 
Linear Integrated Circuits ( Op-amp/ Regulator/ PWM) Functional & Parametric Measurements

Discrete Devices

 

 3000 V/ 400 A

Resistors

 

 1 Ω to 1 MΩ (NABL accredited)

Capacitors

 

 10 pF to 1 F

Inductors

 1nH to 10 H

(Test frequency up to 30 MHz)

Crystal Oscillators

Square wave up to 80 MHz

 

Pulse Transformers

180 mA/ 60 V (Max) ,Single & dual type

List of Major Facilities

Facility / Equipment / Tools Make and Model

Universal Test System   

SZ M3000

Intelligent Universal Programmer

ESA IUP- XP

Programmable DC Source

Yokogawa- 7651

Digital Storage Oscilloscope   

TDS-2014

Curve Tracer

Tektronix 370A, Tektronix 371A

8½ digit Digital Multimeter

Fluke 8508A

7½ digit Digital Multimeter

Wavetek 1271

Digital Storage Oscilloscope

Tektronix 3054C, Owon SDS 8202

LCR Meter

Agilent E4980A, HP 4284A,  HP 4285A

Function Generator

Tektronix AFG3051C

Major Devices Tested (Leaded / SMD)

  • Digital Integrated Circuits (SSI/MSI/LSI)
  • Linear Integrated Circuits (Op-amp/ Regulator/ PWM)
  • Discrete Devices (Diodes, Transistors, MOSFETs, SCRs ….)
  • Passive Devices (Resistors, Capacitors, Inductors)
  • Crystal Oscillators
  • Pulse Transformers